Standards

Transport Canada Engineering Standards

Safety Standards

Grade Crossings Standards

Other Standards

Vehicle Traffic Control Signal Heads: Light Emitting Diode (LED) Circular Signal Supplement, section 4.2 Chromaticity, prepared by the Joint Industry and Traffic Engineering Council Committee, published by the Institute of Transportation Engineers, June 2005. 

The Vehicle Traffic Control Signal Heads: Light Emitting Diode (LED) Circular Signal Supplement of the Institute of Transportation Engineers, was prepared by the Joint Industry and Traffic Engineering Council Committee. The purpose of section 4.2 Chromaticity, is to specify the chromaticity requirements for light emitting diode (LED) vehicle traffic signal modules while in service. This section is incorporated by reference to the proposed Grade Crossings Regulations. To obtain a copy of the document, search online or contact the Institute of Transportation Engineers.

Pedestrian Traffic Control Signal Indications - Part 2: Light Emitting Diode (LED) Pedestrian Traffic Signal Modules, prepared by the Joint Industry and Traffic Engineering Council Committee, published by the Institute of Transportation Engineers, March 19 2004

The Pedestrian Traffic Control Signal Indications - Part 2: Light Emitting Diode (LED) Pedestrian Traffic Signal Modules of the Institute of Transportation Engineers, was prepared by the Joint Industry and Traffic Engineering Council Committee. The purpose of this specification is to provide the minimum performance requirements for the “walking person” and “hand” icon pedestrian signal modules. This specification is incorporated by reference to the proposed Grade Crossings Regulations.

To obtain a copy of the document, search online or contact the Institute of Transportation Engineers.
 

Method 1010.8 Temperature cycling - MIL-STD-883Hextract of Test Method Standard, Microcircuits, MIL-STD-883H, published by the Department of Defense of the United States, February 26, 2010

Method 1010.8 Temperature cycling - MIL-STD-883H is an extract of Test Method Standard, Microcircuits, MIL-STD-883H, published by the Department of Defense of the United States. This test is conducted to determine the resistance of a part to extremes of high and low temperatures, and to the effect of alternate exposures to these extremes. This method is incorporated by reference to the proposed Grade Crossings Regulations.

To obtain a copy of the document, search online or contact the Department of Defense of the United States.

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